Faster batch forgery identification

Daniel J.  Bernstein; Jeroen Doumen; Tanja Lange; Jan-Jaap Oosterwijk

Paper 2012/549 Original: eprint.iacr.org/2012/549 ↗

Faster batch forgery identification

Daniel J. Bernstein

Jeroen Doumen

Tanja Lange

Jan-Jaap Oosterwijk

Abstract

Batch signature verification detects whether a batch of signatures contains any forgeries. Batch forgery identification pinpoints the location of each forgery. Existing forgery-identification schemes vary in their strategies for selecting subbatches to verify (individual checks, binary search, combinatorial designs, etc.) and in their strategies for verifying subbatches. This paper exploits synergies between these two levels of strategies, reducing the cost of batch forgery identification for elliptic-curve signatures.

Metadata

Available format(s): PDF
Category: Public-key cryptography
Publication info: Preprint.
History: 2012-09-22: last updated; 2012-09-22: published
Short URL: https://ia.cr/2012/549
License: https://creativecommons.org/licenses/by/4.0/

BibTeX

@misc{cryptoeprint:2012/549,
      author = {Daniel J.  Bernstein and Jeroen Doumen and Tanja Lange and Jan-Jaap Oosterwijk},
      title = {Faster batch forgery identification},
      howpublished = {Cryptology {ePrint} Archive, Paper 2012/549},
      year = {2012},
      url = {https://eprint.iacr.org/2012/549}
}