Paper 2020/937 Original: eprint.iacr.org/2020/937 ↗
BAM BAM!! On Reliability of EMFI for in-situ Automotive ECU Attacks
Abstract
Electromagnetic Fault Injection (EMFI) is a well-known technique for performing fault injection attacks. While such attacks may be easy demonstrated in a laboratory condition, information about the applicability of them to real-life environments is critical for designer of ECUs to understand the effort that should be spent on protecting against them. This work targets a recent (2019) automotive ECU, and analyzes the target microcontroller used in laboratory conditions, and then transitions the attack to a real-world “in-situ” attack similar to a garage bench. The specific work appears relevant to several devices in the MPC55xx and MPC56xx series, which are automotive-focused PowerPC devices.
Metadata
- Available format(s)
PDF- Category
- Applications
- Publication info
- Preprint.
- History
- 2020-09-06: last updated
- 2020-07-29: published
- Short URL
- https://ia.cr/2020/937
- License
- https://creativecommons.org/licenses/by/4.0/
BibTeX
@misc{cryptoeprint:2020/937,
author = {Colin O'Flynn},
title = {BAM BAM!! On Reliability of EMFI for in-situ Automotive ECU Attacks},
howpublished = {Cryptology {ePrint} Archive, Paper 2020/937},
year = {2020},
url = {https://eprint.iacr.org/2020/937}
}