Paper 2024/396 Original: eprint.iacr.org/2024/396 ↗
On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology
Abstract
The possible effects of irradiation on security controllers implemented in CMOS technology are studied. First, the decrease of the effectiveness of a light sensor/detector as countermeasure against laser fault injection is analysed. Second, the use of irradiation as fault injection method is proposed.
Metadata
- Available format(s)
PDF- Category
- Implementation
- Publication info
- Preprint.
- History
- 2024-03-04: last updated
- 2024-03-04: published
- Short URL
- https://ia.cr/2024/396
- License
- https://creativecommons.org/licenses/by/4.0/
BibTeX
@misc{cryptoeprint:2024/396,
author = {Theresa Krüger},
title = {On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology},
howpublished = {Cryptology {ePrint} Archive, Paper 2024/396},
year = {2024},
url = {https://eprint.iacr.org/2024/396}
}